Speaker
Thomas Juffmann
(University of Vienna, Austria)
Description
In electron microscopy, it is crucial to minimize dose in order to prevent
electron-induced specimen damage. We will discuss an information theoretical
approach to quantifying the information that can be obtained about
certain parameters of interest in a given microscope. We will then present results
on optical wave-front shaping and optical near-field electron microscopy
and will discuss how these techniques can help to reduce damage in electron
microscopy.
