11–13 May 2026
Slovanka
Europe/Prague timezone

Non-invasive plasma diagnostics for low temperature deposition of VO2-based thin film by magnetron sputtering

12 May 2026, 11:40
20m
Slov - "Sál A. Kochanovské" - část A (podium) Solid/1.NP/P.23/1 (Slovanka)

Slov - "Sál A. Kochanovské" - část A (podium) Solid/1.NP/P.23/1

Slovanka

Pod vodárenskou věží 2531/3, 182 00 Prague 8
100
Talk Division of Optics Division of Optics and HiLASE

Speaker

Xiao Li (Division of Optics, Department of Low-Temperature Plasma)

Description

To regulate reactive HiPIMS processes of vanadium oxides, plasma diagnostics based on the RF Sobolewski probe theory has been carried out. In addition to the typical approach of using a probe inserted into the chamber at the substrate side, a novel non-invasive approach using the target as an in-situ probe has also been developed. The RF Sobolewski probe method enables the measurements of ion flux, plasma density, electron temperature, as well as the sheath impedance during the HiPIMS process. The plasma characterization reveals that the imaginary part of sheath impedance is the most promising parameter for future HiPIMS process regulation. Furthermore, from the HiPIMS discharge waveforms, it is found that the average cathode current per pulse proves to be more suitable than the peak current (density) for process regulation when constant HiPIMS average power is maintained.

Author

Xiao Li (Division of Optics, Department of Low-Temperature Plasma)

Presentation materials